Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1986-12-29
1988-10-04
Rosenberger, R. A.
Optics: measuring and testing
By polarized light examination
With light attenuation
356 1, G01B 1124
Patent
active
047752351
ABSTRACT:
An optical spot scanning system for use in three dimensional measurement and inspection of an object surface wherein a deflector means is placed in the path of the projection axis of the spot projector to deflect the portion of same between the deflector and the object surface, thereby moving the spot to various positions on the object surface, and wherein the deflector means is also positioned in the path of the optical axis of the system sensing means to deflect the portion of same between the sensing means and the object surface by the same degree as the portion of the projection axis is deflected, thereby ensuring the axes portions which are aligned to be coplanar remain coplanar, and that the image of the spot on the object surface will be properly conveyed to the linear sensor array in the sensing means.
REFERENCES:
patent: 4171917 (1979-10-01), Pirlet
patent: 4553844 (1985-11-01), Nakagawa et al.
patent: 4627734 (1986-12-01), Rioux
Hecker Joel
Stern Howard K.
Robotic Vision Systems Inc.
Rosenberger R. A.
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