Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent
1997-10-02
1999-03-23
Evans, F. L.
Optics: measuring and testing
By dispersed light spectroscopy
Utilizing a spectrometer
356334, G01J 318
Patent
active
058867856
ABSTRACT:
The invention relates to an optical spectrum analyzer of an incident light beam (101) and a process for analyzing the corresponding spectrum. The spectrum analyzer comprises addressing means (1), a diffraction grating (2), a reflecting dihedron (3), a device (4) for adjusting the rotation of the reflecting dihedron and reception means (5). A polarization separator (11) divides the incident beam (101) into a first and second parallel secondary beam (102, 104), of linearly polarized light along the directions parallel to and perpendicular to the grooves in the grating respectively, and a .lambda./2 plate (12) placed on the path of the first secondary beam (102) applies a perpendicular polarization direction to this beam. The grating diffracts the secondary beams (103, 104) a first time, the reflecting dihedron exchanges their directions, the grating diffracts them a second time, the .lambda./2 plate applies a 90.degree. rotation to the polarization state of the second secondary beam (110) and the separator recombines the secondary beams (109, 111) into a single main beam (112) returned to reception means.
REFERENCES:
J.P. Sage et al., "High Power Funable Dual Frequency Laser System", Optics Communications, vol. 42, No. 6, 1982, Amsterdam, Netherlands, pp. 428-430.
LaLoux Bernard
Lefevre Herve
Mangeot Denis
Martin Philippe
Merigot Bertrand
Evans F. L.
Photonetics
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