Optics: measuring and testing – By particle light scattering – With photocell detection
Patent
1998-02-23
1999-10-05
Kim, Robert H.
Optics: measuring and testing
By particle light scattering
With photocell detection
356358, 356345, G01B 902
Patent
active
059633220
ABSTRACT:
An optical spectrometer (1) with an interferometer having a means for varying the optical path difference comprising a drive (8), and with a detector (6) for recording optical signals from the interferometer and converting them into electrical analog signals, wherein an analog-to-digital converter (ADC) (9) is connected to the detector (6) digitizing the electrical analog signals in a time-equidistant manner, is characterized in that the data acquisition electronics (17) are supplied by a switched power supply (14), the clock of which is derived from the same reference oscillator (16) as the clock of the signal digitization by the ADC (9). In contrast to known spectrometers with spatially equidistant sampling of the detector signal, the design of the spectrometer according to the invention is considerably cheaper and more compact with respect to its voltage supply elements. Galvanic separation of the data acquisition electronics and the electronic control unit of the linear drive is no longer required.
REFERENCES:
patent: 5117466 (1992-05-01), Buican et al.
patent: 5422721 (1995-06-01), Ryan
Applied Optics, vol. 35, No. 16 (Jun. 1, 1996): James Brault New approach to high-precision Fourier transform spectrometer design pp. 2891-2896.
Werner Herres and J. Gronholz: "Datenverarbeitung in der FT-IR-Spektroskopie" in Comp. Anw. Lab., No. 5/1984, pp. 352-356, vol. 6/1984, pp. 418-425 and vol. 5/1985, pp. 230-240.
Rapp Norbert
Simon Arno
Bruker Analytik GmbH
Kim Robert H.
Lee Andrew H.
Vincent Paul
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