Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1996-03-11
1997-09-02
Nelms, David C.
Optics: measuring and testing
By polarized light examination
With light attenuation
356373, 250237G, 25055937, 2502221, G01B 1124
Patent
active
056637969
ABSTRACT:
In an optical apparatus utilizing moire fringes to inspect surface irregularities of a test object, a single light beam forms a light beam network in an optical sensor (28) such that the test object can be two-dimensionally detected, thereby preventing the test object from abnormally approaching a moire grating (12). The light beam is reflected between a pair of mirrors (50, 52) a plurality of times within an identical plane and then the optical sensor (28) detects the intensity of the light beam. The optical sensor (28) is disposed such that the light beam network is positioned directly below the moire grating (12). Accordingly, a test object (2) abnormally approaching the moire grating (12) can be two-dimensionally detected by the light beam network, thereby improving the accuracy in detection.
REFERENCES:
patent: 3524066 (1970-08-01), Blakkan
patent: 3677652 (1972-07-01), Little
patent: 4792678 (1988-12-01), Spies
patent: 5485276 (1996-01-01), Bien et al.
Kanaya Motonori
Yamasaki Kazuyoshi
Fuji Photo Optical Co., Ltd.
Nelms David C.
Smith Zandra V.
Snider Ronald R.
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