Optics: measuring and testing – By light interference
Reexamination Certificate
2008-04-29
2008-04-29
Connolly, Patrick (Department: 2877)
Optics: measuring and testing
By light interference
Reexamination Certificate
active
11178077
ABSTRACT:
Disclosed is an optical sensing device, which comprises a light source emitting a light; a beam splitter; an SPR sensor unit comprising a sensing surface; and a detecting mechanism; and a converting unit converting the first beam and the second beam from the optical device into a two-dimensional interference fringe pattern. From the above-mentioned configuration, an extra phase shift of a detection beam in SPR phase measurement is obtained. The differential measurement approach has shown to achieve a sensitivity figure significantly better than the best result that can be obtained from the prior art in the field of the measurement based on an SPR sensor.
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Ho Ho Pui
Kong Siu Kai
Law Wing Cheung
Lin Chinlon
Wong Chi Lok
Connolly Patrick
Marquis Thomas R.
The Chinese University of Hong Kong
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