Optical sampling waveform measuring apparatus

Optics: measuring and testing – Lamp beam direction or pattern

Reexamination Certificate

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C356S124500

Reexamination Certificate

active

06980290

ABSTRACT:
An optical sampling waveform measuring apparatus can measure waveform of a high-speed signal light P8sensitively, accurately, and in high time resolution, Raman shift light which is generated from a light pulse having a narrower pulse width than the signal light to be measured is used as a sampling light pulse.

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patent: 6373867 (2002-04-01), Lin et al.
patent: 2003/0016347 (2003-01-01), Ohta
patent: 6-63869 (1994-08-01), None
patent: 8-233662 (1996-09-01), None
Kawaguchi et al., “Development of 310-GHz optical sampling system”, (and English abstract) The Institute of Electronics, Information and Communication Engineers, Society Meeting, B-10-149, 2000.
Nogiwa, et al., “Development of highly sensitive optical-sampling system using a PPLN crystal”, (and English abstract) The Institute of Electronics, Information and Communications Engineers, General Meeting, B-10-170, 2000.
Nishizawa et al., “Compact system of wavelength-tunable femtosecond soliton pulse generation using optical fibers” IEEE Photonics Technology Letters vol. 11, No. 3, 1999.

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