Radiant energy – Radiation controlling means
Reexamination Certificate
2008-01-22
2008-01-22
Berman, Jack I. (Department: 2881)
Radiant energy
Radiation controlling means
C378S145000
Reexamination Certificate
active
07321127
ABSTRACT:
The invention provides an optical reflector element (1) for a beam of X-rays (RX) or of gamma-rays or of high-energy particles at grazing incidence, the element being constituted by a stack of superposed silicon plates (10-12). Each plate (10-12) has a reflecting top face (101-121) possibly coated with a metallic film, a multilayer or a dispersive grating and a bottom face carrying ribs (100-120) forming spacers between two successive plates (10-11, 11-12), and defining determined spacing between two successive reflecting faces (101-121). The invention also provides optical instruments comprising several such elements, in particular a type I Wolter telescope comprising two mirrors in tandem having respective paraboloid and hyperboloid surfaces of revolution or a conical approximation thereof or a Kirkpatrick-Beaz system.
REFERENCES:
patent: 3543024 (1970-11-01), Kantor
patent: 3937969 (1976-02-01), Muehllehner
patent: 4054800 (1977-10-01), Leask
patent: 4461018 (1984-07-01), Ice et al.
patent: 5016267 (1991-05-01), Wilkins
patent: 5982562 (1999-11-01), Rode
patent: 6048070 (2000-04-01), LaFiandra
patent: 6363136 (2002-03-01), Flisikowski et al.
patent: 1 085 528 (2001-03-01), None
Preliminary Search Report.
M.K. Joy, et al., “The Imaging Properties of a Silicon Wafer X-Ray Telescope,” SPIE, 1994, pp. 283-286, vol. 2279, The International Society for Optical Engineering, Bellingham, WA.
Paul Kirkpatrick, et al., “Formation of Optical Images by X-Rays,” Journal of the Optical Society of American, Sep. 1948, pp. 766-774, vol. 28, No. 9, Optical Society of America, Washington D.C.
R.C. Woodbury, et al., “Curved Silicon Substrates for Multilayer Structures,” SPIE, 1986, pp. 69-75, vol. 691, The International Society of Optical Engineering, Bellingham, WA.
Larry V. Knight, “The Investigation of Multilayer X-Ray Reflectors as X-Ray Optical Elements,” Final Report to the U.S. Department of Energy San Francisco operations Office, DOE/DP/10741-1, Dec. 15, 1989, pp. 1-52, Brigham Young University Department of Physics, Provo, Utah.
M.W. Beijersbergen, et al., High-Resolution Micro-Pore X-Ray Optics Produced with Micro-Channel Plate Technology, SPIE, 2001, pp. 188-192, vol. 4145. The International Society for Optical Engineering, Bellingham, WA.
Bavdaz Marcos
Beijersbergen Marco Wilhelmus
Berman Jack I.
European Space Agency
Frost Brown Todd LLC
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