Optical reflectometry using integrated VCSEL photodiode chip

Details Optical reflectometry using integrated VCSEL photodiode chip Optical reflectometry using integrated VCSEL photodiode chip

2008-07-22

2008-07-22

Nguyen, Tu T (Department: 2886)

Optics: measuring and testing

For optical fiber or waveguide inspection

Reexamination Certificate

active

07403275

ABSTRACT:
Optical time domain and frequency domain reflectometry using a VCSEL-photodiode combination. Optical time domain reflectometry can be accomplished using an integrated VCSEL-Photodiode. A pulse is emitted by the VCSEL and a reflection caused by an occurrence of interest along an optical waveguide is detected by the photodiode. The time between when the pulse is emitted and when the reflection is received can be used to determine a distance to the occurrence of interest. In Optical frequency domain applications, a VCSEL is wavelength modulated. An occurrence of interest will affect the output of the VCSEL. The affected output is detected and used to determine a distance to the occurrence of interest.

REFERENCES:
patent: 7218388 (2007-05-01), Keeler et al.
Passy, R., et al., “Experimental and Theoretical Investigations of Coherent OFDR with Semiconductor Laser Sources” Journal of Lightwave Technology, vol. 12, No. 9, Sep. 1994, pp. 1622-1630.
Derickson, Dennis, et al., “Fiber Optic Test and Measurement”, 1998 Hewlett-Packard Company, Optical Reflectometry for Component Characterization Chap. 10, pp. 420-431.

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