Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Patent
1999-08-30
2000-08-29
Peeso, Thomas R.
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
702 69, H03K 500
Patent
active
061121606
DESCRIPTION:
BRIEF SUMMARY
BACKGROUND OF THE INVENTION
The present invention relates to optical recording measurement package and, more particularly, to methods for measuring, buffering, analyzing and displaying features in optically recorded data waveforms. currently, optical recording (OR) data waveforms are measured and tested using a combination of test instruments, including digital storage oscilloscopes (DSOs) and timing analyzers. While such test instruments provide valuable information to the user, their ability to analyze particular types of signals, e.g., OR data waveforms, are limited. Due to such limitations, these complex signals often are analyzed by human eye which provides opportunity for error and imprecision. Furthermore, human eye analysis generally cannot be automated. Thus, there is a need to provide an optical recording measurement package which addresses the measurement needs of, for example, manufacturers of CD-ROM and magnetic optical products.
OBJECTS OF THE INVENTION
Therefore, it is an object of the present invention to provide optical recording measurement package which overcome the shortcomings of the above-mentioned devices.
Another object of the present invention is to provide optical recording measurement package which is capable of analyzing OR data waveforms in a manner not previously possible.
A further object of the present invention is to provide various techniques for measuring and identifying the OR data (e.g., pits and spaces) represented by the OR data waveforms.
An additional object of this invention is to provide a technique for categorizing the OR data and displaying the categorized data to a user in a manner previously not possible by digital storage oscilloscopes.
Still another object of the present invention is to provide optical recording measurement package which analyzes OR data waveforms in a quick, efficient, unique and automatic manner.
Various other objects, advantages and features of the present invention will become readily apparent to those of ordinary skill in the art, and the novel features will be particularly pointed out in the appended claims.
SUMMARY OF THE INVENTION
In accordance with one embodiment of the present invention, method is provided for determining when a waveform (i.e., a pulse-width modulated waveform) enters either a first zone or a third zone of a three zone band that has a second zone between the first and third zones and which includes a predetermined threshold level, the entered zone being identified as a designated zone, identifying after the waveform enters the designated zone that position of the waveform at which it crosses the predetermined threshold level as one of the feature edges of the waveform, then determining when the waveform enters the other zone (i.e., the first or third zone) that is not the designated zone, identifying the next position of the waveform at which it crosses the predetermined threshold level as another feature edge of the waveform, repeating the previous steps until the end of the waveform is reached, and then identifying each feature of the waveform from the identified features edges.
In accordance with another embodiment of the present invention, method is provided for identifying the first position of the waveform that has a level within either the first or third zone (designated the starting zone), identifying the next position of the waveform at which it crosses the predetermined threshold level as the beginning position of the first feature, then determining when the waveform enters the other zone (i.e., the first or third zone) that is not the starting zone, identifying the next position of the waveform at which it crosses the predetermined threshold level as the ending position of the first feature and the beginning position of the next feature, determining when the waveform again enters the starting zone, identifying the next position of the waveform at which it crosses the predetermined threshold level as the ending position of the feature and as the beginning position of another feature, and repeating
REFERENCES:
patent: 3665169 (1972-05-01), Henderson et al.
patent: 3913095 (1975-10-01), Dlugos
patent: 4047007 (1977-09-01), Dlugos et al.
Juskovic Gerald
Pupalaikis Peter J.
Salant Lawrence S.
Frommer William S.
LeCroy Corporation
Peeso Thomas R.
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