Optical receiver calibration based on a relative intensity noise

Details Optical receiver calibration based on a relative intensity noise Optical receiver calibration based on a relative intensity noise

1996-08-09

1997-12-23

Raevis, Robert

Measuring and testing

Instrument proving or calibrating

Volume of flow, speed of flow, volume rate of flow, or mass...

2502521A, 356243, G01N 2100

Patent

active

057009490

ABSTRACT:
A relative intensity noise (RIN) standard provides a reference optical noise signal used to characterize the relative frequency response and calibrate the absolute level of an optical receiver. The RIN standard includes an optical filter, illuminated by a high power optical noise source, or alternatively, the RIN standard includes a coherent laser signal combined with amplified spontaneous emission from a variety of gain media. The RIN standard is characterized and marked with a specific RIN value and is readily transported between measurement sites, providing a portable standard for optical receiver calibration. The reference optical noise signal is applied to the optical receiver to characterize the receiver's transfer function. Once the transfer function of the optical receiver is characterized and the receiver is calibrated using the RIN standard, optical noise figure and other performance parameters of high bandwidth optical components are readily measured.

REFERENCES:
patent: 4921347 (1990-05-01), Wong et al.
patent: 5561290 (1996-10-01), Strobel et al.
"Broadband Frequency Characterization of Optical Receivers Using Intensity Noise"; Hewlett-Packard Journal, Feb. 1995, pp. 6-12.
"High-Frequency Photodiode Characterization Using A Filtered Intensity Noise Technique"; IEEE Photonics Technology Letters, vol. 6, No. 10, Oct. 1994, pp. 1258-1260.
"Erbium-Doped Fiber Amplifiers Use In Optical Fiber Communications"; JEE, Apr. 1994, Hiroshi Arimoto.
"Wide-bandwith Receiver/Photodetector Frequency Response Measurements Using Amplified Spontaneous Emission From A Semiconductor Optical Amplifier"; Elliot Eichen, John Schlafer, William Rideout, John McCabe; J. Lightwave Technol., vol. 8, No. 6, pp. 912-916, 1990.
"Relative Intensity Noise In Semiconductor Optical Amplifier", William Ridout, Elliot Eichen, John Schlafer, Joanne Lacourse, Ed Meland; IEEE Photon. Technol. Lett., vol. 1, No. 12, pp. 438-440, 1989.

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