Optical profiler using improved phase shifting interferometry

Details Optical profiler using improved phase shifting interferometry Optical profiler using improved phase shifting interferometry

1985-09-27

1987-01-27

LaRoche, Eugene R.

Optics: measuring and testing

By dispersed light spectroscopy

Utilizing a spectrometer

356360, G01B 902

Patent

active

046391398

ABSTRACT:
An optical profiler includes a two-beam interferometer. An interference pattern produced thereby is focused onto an array of photocells. Phase shift in a reference beam of the interferometer is produced by accelerating a piezoelectric transducer supporting the interferometer mirror to a constant velocity. The velocity is maintained constant for at least 360.degree. of phase shift, during which four integrated buckets are obtained from each photocell. The outputs of the photodetector array are continuously integrated and effectively read out every 90.degree. of phase shift of the reference beam by a computer that computes a first value of phase corresponding to each photocell output from the first, second, and third integrated buckets produced by that photocell and a second phase value from the second, third, and fourth integrated bucket values obtained from that photocell. The two phase values are averaged, eliminating the effects of sinusoidal noise produced by inaccuracies in the reference beam phase at which integrated buckets are initiated and terminated. Data points at which intensity modulation produced by the reference beam phase variation is less than a noise threshold are masked from phase calculations. The intensity of the interferometer light source is automatically controlled by averaging intensity of the intereference pattern at angles that differ by 180.degree. to cancel out the effects of the interference and obtain an average intensity. The lamp voltage is automatically adjusted to maintain the average intensity.

REFERENCES:
patent: 3694088 (1972-09-01), Gallagher et al.
patent: 3796495 (1974-03-01), Laub
patent: 4225240 (1980-09-01), Balasubramanian
patent: 4576479 (1986-03-01), Downs
Schwider, et al. "Digital Wave-Front Measuring Interferometry: Some Systematic Error Sources" Applied Optics, vol. 22, No. 21, 11/83, pp. 3421-3432.
Wyant et al., "An Optical Profiler for Surface Characterization of Magnetic Media", 38th Annual Meeting ASLE, Houston, Tex., 4/83.
Wyant, "Use of an AC Heterodyne Lateral Shear Interferometer with Real Time Wavefront Correction Systems", Applied Optics, vol. 14, No. 11, 11/75.

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