Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1988-05-09
1990-03-06
Evans, F. L.
Optics: measuring and testing
By polarized light examination
With light attenuation
356386, 356394, 356398, 356428, 356240, 250223B, 250560, 209525, G01B 1124, G01B 1110
Patent
active
049060988
ABSTRACT:
An apparatus for measuring the profile of portions of an article located within a predefined plane. Each portion is scanned, such as by an optical micrometer providing a beam of radiant energy, to determine its dimension. The distance between each portion and a vertical reference is also scanned to determine its dimension. The article is rotated about an axis intersecting the predefined plane within the scan of the beam and is axially moved along an axis parallel to the intersecting axis within the scan of the beam so that the dimension of each portion and its distance from the vertical reference can be determined. The apparatus may be used in combination with a cavity identification system to control manufacturing employing multiple molds.
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Thomas Alan E.
Thompson Leon E.
Evans F. L.
Glass Technology Development Corporation
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