Optical position measuring device

Optics: measuring and testing – Angle measuring or angular axial alignment – Relative attitude indication along 3 axes with photodetection

Reexamination Certificate

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Details

C356S139010, C356S141100, C356S152100, C356S614000, C250S231100, C033S0010PT, C033S0010DD

Reexamination Certificate

active

07123354

ABSTRACT:
An optical position measuring arrangement that includes an incremental measuring graduation and a scanning unit, which can be moved in relation to the incremental measuring graduation along a measuring direction and by which position-dependent incremental signals are generated from scanning the measuring graduation. The scanning unit includes a transparent support substrate and two incremental signal scanning arrangements arranged in the measuring direction. Each of the incremental scanning arrangements includes a light source and several incremental signal detector elements, wherein the incremental signal scanning arrangements are arranged on a side of the support substrate facing away from the incremental measuring graduation. The scanning unit includes several fields with scanning gratings, each field is spatially assigned to corresponding incremental signal detector elements and is arranged between the incremental signal scanning arrangements and the support substrate, wherein the scanning gratings are arranged so that partial incremental signals with predetermined phase relations are generated from the incremental signal detector elements.

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patent: 5841134 (1998-11-01), Burgschat et al.
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Reiner Burgschat “Die Neue Dimension in der Weg- und Winkelmesstechnik,” F&M, vol. 104, No. 10, 1996, pp. 752-754 and 756.
Numerik Jena Company Brochure entitled “Optical Encoder Systems by Numerik Jena Encoder-Kit L,” published by Numerik Jena, Mar. 1999, 8 pages.

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