Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1980-09-02
1983-12-13
Punter, William H.
Optics: measuring and testing
By polarized light examination
With light attenuation
250224, 350171, 350319, G01B 1114, G02B 2717, G02B 500
Patent
active
044202610
ABSTRACT:
An optical position location apparatus for locating the position of an object in one or more dimensions, which relies upon one or more sources of radiant energy and distributor devices to disburse such radiant energy over a location region or window. Integrated collector assemblies positioned opposite to the distributors receive and collect the transmission of the distributed radiant energy and through reflection or refraction, transfer radiant energy to a minimum of detection locations to monitor the absence or alteration thereof. A rotating optical scanner and a detector are utilized with a continuous stationary light source to successively monitor specific location-coordinate-related portions of transmitted radiant energy and through electronic circuitry, a signal is developed to disclose, with accuracy, the location of objects within the location region "window", as well as other parameters including object size. In other embodiments, an apparatus with elements cooperating along two dimensions is capable of yielding three-dimensional object parameter information.
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Barlow Gordon A.
Karlin Richard A.
Krutsch John R.
Tutt Timothy T.
Alter Irwin C.
Lowbar, Inc.
Punter William H.
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