Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate
2003-06-20
2008-03-18
Chawan, Sheela (Department: 2624)
Image analysis
Applications
Manufacturing or product inspection
C382S312000, C358S498000, C399S205000, C355S057000, C250S234000
Reexamination Certificate
active
07346206
ABSTRACT:
An optical object detector including a feed path, a reference pattern facing the feed path, and an optical sensor configured to view the reference pattern through the feed path, absence of the reference pattern from the view of the optical sensor indicating presence of an object in the feed path.
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Hill Edward A
Ko Ken
Chawan Sheela
Hewlett--Packard Development Company, L.P.
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