Optical near-field microscope

Radiant energy – Photocells; circuits and apparatus – Photocell controls its own optical systems

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C250S306000

Reexamination Certificate

active

06674057

ABSTRACT:

BACKGROUND OF THE INVENTION
a) Field of the Invention
The invention relates to an improvement in optical near-field microscopes.
b) Description of Related Art
FIG. 1
shows the well-known construction of a SNOM arrangement. A near-field probe shaped as a tip SP is located at a distance of less than the light wavelength above the surface of a transparent specimen P. The specimen is held on a scanning table STI which is movable in the X/Y/z direction, so that the specimen can be scanned linewise by the tip SP. The scanning table STI is controlled by a control unit AE. The light which is not absorbed is collected by an objective O
1
and its intensity is measured by a detector DT, for example, an avalanche diode or a PMT, arranged behind a pinhole PH for suppressing scattered light. An image of the surface of the specimen is composed from this. It is further known to reverse the light path and illuminate the specimen through the objective, the transmitted light being collected through the tip SP.
The scanning movement of the specimen results in restrictions in the specimen geometry and in the maximum attainable scanning speed. One reason against a scanning movement of the tip is that the probe and optical construction move relative to one another. Accordingly, it is not possible, for example, to detect the light emitted by the probe confocally or to illuminate confocally the specimen site under examination. The first arrangement is advantageous for suppression of scattered light, the second arrangement prevents bleaching out of dyes in fluorescence measurements. Moreover, it is not possible to stop down larger or smaller apertures (e.g., forbidden light).
OBJECT AND SUMMARY OF THE INVENTION
It is the primary object of the invention to avoid these disadvantages. This object is met by a near-field optical microscope according to the invention, with a probe tip which is arranged on one side of a light transmitting specimen and moved in a scanning manner. The probe tip serves as a point light source, wherein optics for collecting light transmitted through the specimen and transmitting it to a detection unit or for collecting illumination light are provided on the other side of the specimen. The movement of the probe tip is adapted to on the detection side.


REFERENCES:
patent: 5138159 (1992-08-01), Takase et al.
patent: 5304795 (1994-04-01), Fujihira et al.
patent: 5333495 (1994-08-01), Yamaguchi et al.
patent: 5343460 (1994-08-01), Miyazaki et al.
patent: 5361314 (1994-11-01), Kopelman et al.
patent: 6229609 (2001-05-01), Muramatsu et al.
patent: WO 97/30366 (1997-08-01), None
XP 000518228 / Optical Engineering, Aug. 1994 “Super-resolution imaging and detection of fluorescence from single molecules by scanning near-field optical microscopy” Alfred J. Meixner, et al. (pp. 2324-2332).
XP 00511233 / Review of Scientific Instruments, Jun. 1995 “Design and construction of a versatile scanning near-field optical microscope for fluorescence imaging of single molecules” G. Tarrach, et al. (pp. 3569-3575).

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Optical near-field microscope does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Optical near-field microscope, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Optical near-field microscope will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3188978

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.