Radiant energy – Photocells; circuits and apparatus – Optical or pre-photocell system
Patent
1985-01-18
1987-08-18
LaRoche, Eugene R.
Radiant energy
Photocells; circuits and apparatus
Optical or pre-photocell system
356443, G01N 2101, G06K 710, G06K 714
Patent
active
046879439
ABSTRACT:
A motion picture film flaw detection system wherein a single inspection location is employed at which sound track side edge defects, sprocket hole side edge defects, thickness variations, and defective sprocket holes are analyzed by optical sensors so that no physical contact on the film by feeler arms or the like occurs. Film wear such as by scratching and rubbing is reduced since minimal contact occurs with a surface of the film as it travels through the system. The sprocket holes are analyzed by optics which provide a real image on a projection plane at which location excessive elongation of the sprocket holes is checked. Detection circuits are provided connecting to the optical sensors which derive a reference which automatically tracks averaged or weighted overall signal levels for comparison to signal variations caused by film thickness changes or film flaws. Accordingly, variations in optical system performance are automatically compensated for.
REFERENCES:
patent: 3759095 (1973-09-01), Short, Jr. et al.
patent: 3856414 (1974-12-01), Menary
patent: 3935468 (1976-01-01), Bowen et al.
patent: 4140915 (1979-02-01), Rube et al.
patent: 4166700 (1979-09-01), Bowen et al.
patent: 4264825 (1981-04-01), Bowen
patent: 4276547 (1981-07-01), Bowen et al.
Bowen Howard
Henderson David
Olson Carl
LaRoche Eugene R.
Mis David
Research Technology International
LandOfFree
Optical motion picture film inspection system does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Optical motion picture film inspection system, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Optical motion picture film inspection system will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1119535