Optics: measuring and testing – Shape or surface configuration
Reexamination Certificate
2007-01-02
2007-01-02
Pham, Hoa Q. (Department: 2877)
Optics: measuring and testing
Shape or surface configuration
C356S625000, C356S237500
Reexamination Certificate
active
10534534
ABSTRACT:
A method for studying a surface provided with relief features, wherein a measurement spectrum is taken and then compared with test spectra representative of arbitrary structures that are adjusted stepwise. A correlation over representative points of the spectra is selected while optimizing the determination by a hierarchized adjustment of the parameters.
REFERENCES:
patent: 5900633 (1999-05-01), Solomon et al.
patent: 5963329 (1999-10-01), Conrad et al.
patent: 6462817 (2002-10-01), Strocchia-Rivera
patent: 6483580 (2002-11-01), Xu et al.
patent: 6952271 (2005-10-01), Niu et al.
patent: 7030999 (2006-04-01), Bischoff et al.
patent: 7064829 (2006-06-01), Li et al.
patent: 2002/0113966 (2002-08-01), Shchegrov et al.
patent: 2002/0188580 (2002-12-01), Doddi et al.
patent: 2004/0150838 (2004-08-01), Niu et al.
patent: 2005/0200859 (2005-09-01), Hazart
patent: 2005/0231737 (2005-10-01), Chu
patent: 2006/0119863 (2006-06-01), Li et al.
patent: WO 02/27288 (2002-04-01), None
Commissariat a l''Energie Atomique
Oblon & Spivak, McClelland, Maier & Neustadt P.C.
Pham Hoa Q.
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