Optics: measuring and testing – Dimension
Reexamination Certificate
2007-01-09
2007-01-09
Pham, Hoa Q. (Department: 2877)
Optics: measuring and testing
Dimension
C356S638000
Reexamination Certificate
active
10501327
ABSTRACT:
A light source (1) sends towards an object under test (5) a light beam (2) with such a size as to encompass the object (5). Past the object, the beam (2) is processed by an optical processing system (6), comprising a band-pass spatial filter (8) located in the Fourier Plane of a converging lens (7), the object (5) being located in the front focal plane of that lens. The filtered beam is collected by a detector (10) that generates an electrical signal representative of the intensity of the field distribution associated with that beam. A system (11) for processing the electrical signal comprises a band-pass filter (12) with temporal cut-off frequencies corresponding with the spatial cut-off frequencies of the spatial filter in the optical processing system (6) and obtains the value of the requested quantity form the electrical signal.
REFERENCES:
patent: 4417147 (1983-11-01), Faville
patent: 6922254 (2005-07-01), Blohm et al.
patent: 2003/0160974 (2003-08-01), Demeyere et al.
Area Sistemi S.r.l.
Bacon & Thomas PLLC
Pham Hoa Q.
Ton Tri
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