Optics: measuring and testing – Material strain analysis – By light interference detector
Patent
1985-08-19
1987-09-01
Willis, Davis L.
Optics: measuring and testing
Material strain analysis
By light interference detector
356353, 356354, G01B 902, G01B 1116
Patent
active
046905529
ABSTRACT:
A method and apparatus for measuring strains in a test object in any of a plurality of directions. The object is illuminated with coherent light so that light is reflected to a focussing lens and a shearing diffraction grating having lines extending in a plurality of directions. The various diffracted orders interfere at the focal plane of the lens and are recorded on a photographic media. The object is then stressed and a second exposure is made on the same media, resulting in interference between the fringes produced on the two exposures. The media is developed as a transparency and subjected to optical processing to detect strain in any direction.
REFERENCES:
Hariharan et al., "Double Grating Interferometer . . . ", Optics Communications, vol. 11, No. 3, pp. 317-320, 7/74.
Hariharan, "Speckle-Shearing Interferometry . . . ", Applied Optics, vol. 14, No. 11, p. 2563, 11/75.
Koliopoulos, "Radial Grating Lateral Shear . . . ", Applied Optics, vol. 19, No. 9, pp. 1523-1528, 5/80.
Hung, "Shearography: A New Optical Method . . . ", Optical Engineering, vol. 21, No. 3, pp. 391-395, 6/82.
Grant Ralph M.
Haskell Richard E.
Paskus Anthony
Windeler Stanley R.
Wright Forrest S.
Industrial Holographics, Inc.
Koren Matthew W.
Willis Davis L.
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