Optics: measuring and testing – Inspection of flaws or impurities – Transparent or translucent material
Patent
1997-10-21
2000-06-13
Kim, Robert
Optics: measuring and testing
Inspection of flaws or impurities
Transparent or translucent material
3562392, G01N 2100
Patent
active
060755911
ABSTRACT:
Inspection of an optical object for the existence therein of inhomogeneities, comprises providing a diverging beam of inspection radiation and directing the beam on the optical object so that each point thereof is illuminated at a single angle; projecting the beam through the optical object on a projection screen and obtaining thereby a shadow pattern thereof, the optical inhomogeneities being distinguishable in the shadow pattern owing to the difference in the brightness of the areas corresponding thereto over the background brightness of the pattern; imaging the shadow pattern via the optical object in such a manner that the rays forming the image pass through each point of the optical object at an angle corresponding to the angle at which the point is illuminated; and detecting and analyzing the image of the shadow pattern.
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patent: 4810895 (1989-03-01), Kafri et al.
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Kim Robert
Prolaser Ltd.
Stafira Michael P.
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