Optical measuring system

Optics: measuring and testing – By polarized light examination – With light attenuation

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Details

356387, 250560, 250577, G01B 1104

Patent

active

044615760

ABSTRACT:
An optical gauge having a laser or other such light source, the beam from which is cyclically directed upon a photo-detector by a rotating plane mirror, the time at which or during which in each revolution of the plane mirror the beam impinges upon the photo-detector being commensurate with a linear parameter of a workpiece upon which the beam is also directed, either constantly, as in the first disclosed embodiment, or cyclically as the beam is moved across the workpiece and occluded thereby during a portion of each rotation of the mirror, as in the second disclosed embodiment. The point on the rotating mirror at which the beam is reflected lies at the focal point of a fixed, parabolic mirror. In the first embodiment, used to monitor the surface level of a process liquid, such as molten glass, the beam is directed at an angle upon the surface of the liquid by which it is reflected to a single parabolic mirror and thence to the rotating plane mirror by which it is scanned in a circular path which intersects the photo-detector in each revolution. In the second embodiment, the workpiece is positioned between a pair of parabolic mirrors arranged in coaxial, face-to-face relation. The beam is scanned diametrically across a first parabolic mirror after being reflected by the rotating plane mirror, and is thus reflected to and scanned across the second parabolic mirror except when it is occluded by the workpiece between the two parabolic mirrors. The photo-detector lies at the focal point of the second parabolic mirror and thus receives light at all times that the beam is scanned across the parabolic mirrors except when occluded by the workpiece. Thus, the time during which the beam is occluded during each scan is a function of the position or dimension of the workpiece by which it is occluded.

REFERENCES:
patent: 1706857 (1929-03-01), Mathe
patent: 3625618 (1971-12-01), Bickel
patent: 3741656 (1973-06-01), Shapiro
patent: 3744915 (1973-07-01), Sick
patent: 3905705 (1975-09-01), Petrahilos
patent: 4201476 (1980-05-01), Musto et al.
patent: 4245517 (1981-01-01), Barker et al.

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