Optical measuring method

Details Optical measuring method Optical measuring method

1994-11-09

1997-03-04

Boudreau, Leo

Image analysis

Applications

Manufacturing or product inspection

382141, 356375, 356376, G06K 900, G01B 1124

Patent

active

056088175

ABSTRACT:
An optical measuring method for measuring a position of an edge portion of a workpiece uses an optical measuring apparatus having a projector for radiating a slit light on the workpiece and an image sensing device for picturing an optical cutting image drawn by the slit light radiated on the workpiece. The measuring is made from a pictured optical cutting image on a screen of the image sensing device. In the method, coordinates of an end point on a side of an edge portion of the pictured optical cutting image are obtained. Windows are set in predetermined two positions in that portion of the pictured optical cutting image which extends straight. Coordinates of respective centers of gravity of the pictured optical cutting image inside both the windows are obtained. An equation of a first straight line which passes through both the centers of gravity and an equation of a second straight line which crosses the first straight line at right angles and which passes through the end point are obtained. Coordinates of a crossing point of both the straight lines are obtained.

REFERENCES:
patent: 5129010 (1992-07-01), Higuchi et al.
patent: 5280542 (1994-01-01), Ozeki et al.
patent: 5311289 (1994-05-01), Yamaoka et al.

Affiliated with

Also associated with

Rating

Optical measuring method does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Optical measuring method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Optical measuring method will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2153418