Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1982-12-22
1985-06-04
Rosenberger, R. A.
Optics: measuring and testing
By polarized light examination
With light attenuation
356373, 356387, G01B 1102
Patent
active
045211124
ABSTRACT:
An optical measuring device comprising a parallel scanning ray beam generator, condensing means for condensing said parallel scanning ray beams after said parallel scanning ray beams have passed through a workpiece being measured, and a single light receiving element for sensing the brightness of said scanning ray beams condensed by said condensing means to convert the same into an electric signal, whereby the dimensions of the workpiece being measured are measured from the time length of a dark portion or a bright portion generated due to the obstruction of said parallel scanning ray beams by the workpiece being measured, which has been interposed between the parallel scanning ray beam generator and said light receiving element, a plurality of light emitting elements are arranged in opposed relations to the scanning scope of the parallel scanning ray beams, an output from the light receiving element during a single scanning time is time-shorn in accordance with the number of the light emitting elements to thereby cause the light emitting element or elements to emit light in accordance with the position of the workpiece being measured with respect to the scanning scope.
REFERENCES:
patent: 3730632 (1973-05-01), Chikama
patent: 3922094 (1975-11-01), Colding et al.
patent: 4324982 (1982-04-01), Poulsen
Hamada Hiroyoshi
Kuwabara Yoshiharu
Kuwata Masayuki
Mitutoyo Mfg. Co. Ltd.
Rosenberger R. A.
Vollero Michael F.
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