Optical measuring device

Optics: measuring and testing – By light interference – For dimensional measurement

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C356S497000, C356S511000, C356S609000, C356S241100

Reexamination Certificate

active

06970253

ABSTRACT:
An optical measuring device includes a 3-D measuring set-up for measuring the shapes of test object surfaces in three dimensions, and projection optics including an objective optics, the test object being illuminated by a light source via an illuminating beam using an illuminating optics. A rapid, highly resolving measurement of surface shapes which are nearly radially symmetric is provided by configuring the objective optics as image-flattening optics for covering (measuring) and flattening a curved surface area or as panoramic optics for measuring a radially symmetric surface area that encircles 360°.

REFERENCES:
patent: 4976524 (1990-12-01), Chiba
patent: 5004339 (1991-04-01), Pryor et al.
patent: 5175650 (1992-12-01), Takayama et al.
patent: 5905595 (1999-05-01), Minami
patent: 5933231 (1999-08-01), Bieman et al.
patent: 6069698 (2000-05-01), Takizawa et al.
patent: 6646748 (2003-11-01), Nakamura et al.
patent: 6714307 (2004-03-01), De Groot et al.
patent: 78 19 433 (1978-10-01), None
patent: 34 30 013 (1985-03-01), None
patent: 196 18 558 (1997-11-01), None
patent: 198 06 261 (1998-10-01), None
patent: 197 21 842 (1999-04-01), None
patent: 101 15 524 (2001-11-01), None
patent: WO 00 10047 (2000-02-01), None
A. Donges, R. Noll, “Lasermesstechnick” [Laser Metrology] Hüthig Publishers 1993**.
P. de Groot, L. Deck, “Surface Profiling by Analysis of White-Light Interferograms in the Spatial Frequency Domain” J. Mod. Opt., vol. 42, No. 2, 389-401, 1995**.
Th. Dresel, G. Häusler, H. Venzke, “Three-Dimensional Sensing of Rough surfaces by Coherence Radar”, Appl. Opt., vol. 31, No. 7, 919-925, 1992**.
H.J. Tiziani, “Optical Methods for Precision Measurements”, Optical and Quantum Electronics, vol. 21, 253-383, 1989**.
K. Creath, “Temporal Phase Measurement Method”, d.W. Robinson, T. G. Reid: “Interferogram Analysis”, IOP Publishing Bristol 1993**.
R. Onodera, Y. Ishii, “Two Wavelength Interferometry That Uses a Fourier Transform Method”, Appl. Opt., vol. 37, No. 34, 7988-7994, 1998**.
J.H. McLeod, “Axicons and Their Uses”, J. Opt Soc Am., vol. 50, No. 2, 166-169, 1960**.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Optical measuring device does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Optical measuring device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Optical measuring device will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3457187

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.