Optics: measuring and testing – By particle light scattering – With photocell detection
Reexamination Certificate
2011-03-22
2011-03-22
Stafira, Michael P (Department: 2886)
Optics: measuring and testing
By particle light scattering
With photocell detection
C356S337000
Reexamination Certificate
active
07911610
ABSTRACT:
The present invention relates to an optical measuring device which includes container for storing a sample, and an electrode pair for generating an electric field distribution upon impression of a voltage by an electrical power supply, thereby generating or extinguishing diffraction grating formed by a density modulation of particles within the sample. The particles within the sample are evaluated based upon a temporal change of an intensity of a diffracted light beam obtained by irradiating a light beam upon the diffraction grating formed by the density modulation of the particles. The electrodes constituting the electrode pair are configured to have a comb-like electrode teeth that are parallel with each other and are arranged such that the electrode teeth of one electrode are inserted between the electrode teeth of the other electrode. From such configuration, an optical measuring device of a high sensitivity and excellent S/N ratio can be obtained.
REFERENCES:
patent: 6091492 (2000-07-01), Strickland et al.
patent: 6236458 (2001-05-01), Igushi et al.
patent: 2008/0221711 (2008-09-01), Trainer
patent: 2004-085528 (2004-03-01), None
Inoue Fujio
Moriya Naoji
Nagumo Yuzo
Sakauchi Naofumi
Takebe Masahiro
Cheng Law Group PLLC
Shimadzu Corporation
Stafira Michael P
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