Optics: measuring and testing – Of light reflection – With diffusion
Reexamination Certificate
2008-05-06
2008-05-06
Chowdhury, Tarifur (Department: 2886)
Optics: measuring and testing
Of light reflection
With diffusion
Reexamination Certificate
active
10849777
ABSTRACT:
An optical measuring apparatus comprises: an illuminating section that illuminates a first object with a first light; a light changing section that changes an intensity of the first light illuminating the first object; a light receiving device that receives a second light transmitted through or reflected from the first object; and an output section that outputs a measurement result according to i) a state of the light changing section and ii) an amount of the second light received by the light receiving device. In addition, an optical measuring apparatus comprises: the illuminating section; the light receiving device; a light receiving time changing section that changes a light receiving time of the light receiving device; and an output section that outputs a measurement result according to i) the light receiving time and ii) an amount of the second light received by the light receiving device.
REFERENCES:
patent: 3684378 (1972-08-01), Lord
patent: 3892485 (1975-07-01), Merritt et al.
patent: 3917957 (1975-11-01), Ansevin et al.
patent: 4281897 (1981-08-01), Fletcher
patent: 4443695 (1984-04-01), Kitamura
patent: 4850712 (1989-07-01), Abshire
patent: 5204068 (1993-04-01), O'Loughlin et al.
patent: 5340974 (1994-08-01), Zalewski
patent: 5519204 (1996-05-01), Rudd et al.
patent: 5780843 (1998-07-01), Cliche et al.
patent: 5912454 (1999-06-01), Castillo et al.
patent: 6603103 (2003-08-01), Ulrich et al.
patent: 6924893 (2005-08-01), Oldenbourg et al.
patent: 2002/0014577 (2002-02-01), Ulrich et al.
patent: 61-61431 (1986-04-01), None
patent: 1-282446 (1989-11-01), None
patent: 5-18895 (1993-01-01), None
patent: 6-201467 (1994-07-01), None
patent: 2001-008104 (2001-01-01), None
patent: 2001-203969 (2001-07-01), None
Abe Yoshihiko
Sakaino Yoshiki
Terashima Kaoru
Akanbi Isiaka O
Chowdhury Tarifur
Fujifilm Corporation
LandOfFree
Optical measuring apparatus and optical measuring method does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Optical measuring apparatus and optical measuring method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Optical measuring apparatus and optical measuring method will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3907680