Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1986-08-11
1988-05-10
LaRoche, Eugene R.
Optics: measuring and testing
By polarized light examination
With light attenuation
356375, 250231R, 250231P, 250227, G01B 1100, G01B 1114, G01D 534, H01J 516
Patent
active
047431199
ABSTRACT:
The present invention relates to an optical measuring apparatus for optically measuring physical quantities such as magnetic field, pressure and electric field, which is made from a substance being permeable to a light having a first wave length and shields a light having a second wave length, and in which shielding means changing a ratio of shielding the light having the second wave length in correspondence to a physical quantity to be measured is arranged in a transmission path through which said lights having two kinds of wave length are transmitted, said lights having two kinds of wave length, which passed through or by said shielding means, being received to calculate the ratio of a quantity of the light having the second wave length received to that of the light having the first wave length received, whereby measuring the physical quantity.
REFERENCES:
patent: 4281245 (1981-07-01), Brogardh et al.
patent: 4560868 (1985-12-01), Brogardh et al.
patent: 4644154 (1987-02-01), Brogardh et al.
LaRoche Eugene R.
Mis David
Mitsubishi Denki & Kabushiki Kaisha
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