Optics: measuring and testing – By particle light scattering – With photocell detection
Patent
1986-03-18
1988-04-26
Willis, Davis L.
Optics: measuring and testing
By particle light scattering
With photocell detection
356 355, 356 43, 250227, G01B 902
Patent
active
047400811
ABSTRACT:
An optical sensor (1) is connected to an electro-optical transducer unit (35) and a measuring circuit (36) via an optical delay line (14) and an optical path (15). Error-free measurement values which are independent of the attenuation characteristics of the optical delay line (14) are obtained if the optical sensor (1) comprises a polarization splitter (3) which receives light pulses from the optical path (15) and from the optical delay line (14) and which is followed by a sensor body (2) which is traversed by the light pulses. A mirror (4) arranged on the side of the sensor body (2) on which the light is not incident reflects the light pulses back into the polarization splitter (3), which couples the light pulses back into the optical path (15) and the optical delay line (14).
REFERENCES:
patent: 3925727 (1975-12-01), Duguay
patent: 4025195 (1977-05-01), Ebersole et al.
Helzel Thomas
Martens Gerhard
Faller F. Brice
Turner S. A.
U.S. Philips Corporation
Willis Davis L.
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