Optical measurement of particle concentration

Details Optical measurement of particle concentration Optical measurement of particle concentration

1987-04-06

1990-05-22

Willis, Davis L.

Optics: measuring and testing

By particle light scattering

With photocell detection

G01N 2127, G01N 1506

Patent

active

049281534

ABSTRACT:
Method and apparatus for measuring concentration of micrometer- and submicrometer-size particles on a carrier as a function of Mie scattering in the visible spectrum. A collimated beam of white light is directed through a carrier onto the particles, with a portion of the light energy being scattered and a portion transmitted according to Mie scattering theory. Particle size, index of refraction and measurement wavelength are selected such that scattering extinction varies essentially monotonically with the ratio of particle size to illumination wavelength. Particle concentration is indicated as a function of a difference between light scattered at two wavelengths at opposite ends of the visible spectrum.

REFERENCES:
patent: 3724951 (1973-04-01), Seelbinder
patent: 4047815 (1977-09-01), Sedlacek
patent: 4621063 (1986-11-01), Wyatt et al.

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