Optics: measuring and testing – By particle light scattering – With photocell detection
Patent
1992-01-22
1994-03-01
Turner, Samuel A.
Optics: measuring and testing
By particle light scattering
With photocell detection
356 73, 385 12, G01B 902
Patent
active
052912671
ABSTRACT:
An improved low-coherence reflectometer is disclosed for use in measuring Rayleigh backscattering. The invention utilizes an optical amplifier to amplify the backscattered light thereby reducing the measurement times. The preferred optical amplifier is a diode-pumped superfluorescent fiber which acts both as the amplifier and the low-coherence light source. Reductions in signal averaging times of a factor of 100 are achieved by the use of the amplifier.
REFERENCES:
patent: 5013907 (1991-05-01), Bateyan
patent: 5106193 (1992-04-01), Fesler et al.
"Optical Coherence-Domain Reflectometry: A New Optical Evaluation Technique", Robert C. Youngquist, Sally Carr, and D. E. N. Davies, Optics Letters, vol. 12, No. 3, Mar. 1987.
"New Measurement System for Fault Location in Optical Waveguide Devices Based on an Interferometric Technique", Kazumasa Takada, Itaru Yokohama, Kazumori Chida, and Juichi Noda, Applied Optics, vol. 26, No. 9, May 1, 1987.
"Guided-Wave Reflectormety With Micrometer Resolution", B. L. Danielson and C. D. Whittenberg, Applied Optics, vol. 26, No. 14, Jul. 15, 1987.
Baney Douglas M.
Sorin Wayne V.
Hewlett--Packard Company
Kim Robert
Turner Samuel A.
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