Optics: measuring and testing – By particle light scattering – With photocell detection
Patent
1994-03-18
1994-11-15
Housel, James C.
Optics: measuring and testing
By particle light scattering
With photocell detection
356 731, 25022719, 385 12, G01B 902
Patent
active
053653351
ABSTRACT:
A low-coherence reflectometer for use in measuring optical backscattering. The invention utilizes an optical attenuation in the reference arm of a Michelson interferometer to reduce the relative intensity noise. The invention obtains essentially the same performance as obtained with balanced detector schemes while maintaining the simplicity of the Michelson interferometer design and increased scan distance.
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Takada, et al., "Rayleigh Backscattering Measurements of Single-Mode Fibers by Low-Coherence Optical Time-Domain Reflectometry with 14mm Spatial Resolution", Appl. Phys. Lett., 59, p. 143, 1991.
Takada, et al., "Phase-Noise and Shot-Noise Limited Operations of Low Coherence Optical Time Domain Reflectometry", Appl. Phys. Lett. 59 11 Nov. 1991, pp. 2483-2485.
Masaru Kobayashi et al., "Optical Fiber Component Characterization by High-Intensity and High-Spatial-Resolution Interferometric Optical-Time-Domain Reflectometer", IEEE Photonics Tech. Letters, vol. 3, No. 6, Jun. 1991, pp. 564-566.
Takada, et al., "Ultrahigh-Sensitivity Low Coherence OTDR Using Er.sup.3+ -Doped High-Power Superflourescent Fibre Source", Electronics Letters, Jan. 1992, vol. 28, No. 1, pp. 29-31.
Hewlett--Packard Company
Housel James C.
Pyon Harold Y.
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