Optical line testing device and method for automatically and eff

Details Optical line testing device and method for automatically and eff Optical line testing device and method for automatically and eff

1996-04-22

1997-09-16

McGraw, Vincent P.

Optics: measuring and testing

For optical fiber or waveguide inspection

G01N 2188

Patent

active

056686277

ABSTRACT:
In an optical line testing device, light pulses are radiated to an optical line so as to receive response light, corresponding to each of the light pulses reflected by the optical line, for a certain period of time. The response light is converted to waveform data. The waveform data are averaged to create averaged data. The averaged data are stored in a memory and are also used to visually display a response waveform corresponding to the response light. A human operator manipulates an operator console while looking at the response waveform so as to analyze the response waveform, thus detecting a property of the optical line. A data range is set between first data and last data selected from among the averaged data representing the response waveform. According to an optical line testing method, the data range is partitioned into several regions so that an approximate line is calculated, using a method of least squares, with respect to each of the regions. Based on the relationship between the approximate line and the level of the response waveform, the property of the optical line is measured with respect to a terminal end of the optical line, a position of Fresne's reflection, and a connection loss of the optical line.

REFERENCES:
patent: 4898463 (1990-02-01), Sakamoto et al.
patent: 5450191 (1995-09-01), Parks et al.

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