Optical lens system and position measurement system using...

Optics: measuring and testing – By light interference – For dimensional measurement

Reexamination Certificate

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C359S581000, C359S663000

Reexamination Certificate

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07489406

ABSTRACT:
An optical lens system includes a lens surface capable of forming concentric interference patterns on an object as if light emitted from a single light source were virtually emitted from two or more light sources within a plane containing an optical axis of the single light source.

REFERENCES:
patent: 4181409 (1980-01-01), Whitney et al.
patent: 5523884 (1996-06-01), Jewell et al.
patent: 6005703 (1999-12-01), Maddox et al.
patent: 6831794 (2004-12-01), Schuster et al.
patent: 6876494 (2005-04-01), Ishikawa et al.
patent: 6985236 (2006-01-01), Seko et al.
patent: 7009713 (2006-03-01), Seko et al.
patent: 4-8724 (1992-02-01), None
patent: 10-031213 (1998-02-01), None
patent: 2004-28977 (2004-01-01), None

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