Optical lattice microscopy using periodic interference...

Optical: systems and elements – Compound lens system – Microscope

Reexamination Certificate

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C359S577000, C359S578000, C359S370000

Reexamination Certificate

active

07990611

ABSTRACT:
A microscope includes a source of electromagnetic radiation, having a wavelength, λ1and dividing optical elements configured for dividing the radiation from the source into multiple excitation beams. The microscope also includes a detector and directing optical elements, which are configured for directing each excitation beam in unique directions, such that the beams intersect in an excitation region within a sample to create a two-dimensional or three-dimensional interference pattern of multiple excitation maxima within the sample. The detector has individual detector elements, where the detector elements are configured for detecting light resulting from an interaction of an individual excitation maximum and the sample.

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