Optics: measuring and testing – By alignment in lateral direction
Reexamination Certificate
2007-09-11
2010-11-09
Chowdhury, Tarifur (Department: 2886)
Optics: measuring and testing
By alignment in lateral direction
C356S317000, C356S326000, C356S614000, C422S082050, C436S164000, C436S171000, C436S172000
Reexamination Certificate
active
07830513
ABSTRACT:
An optical interrogation system and method are described herein that are capable of detecting and correcting a positional misalignment of a label independent detection (LID) microplate so that the LID microplate can be properly interrogated after being removed from and then re-inserted back into a microplate holder/XY translation stage.
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Dailey, Jr. Michael J.
Piech Garrett A.
Shedd Gordon M.
Webb Michael B.
Zambrano Elvis A.
Beall Thomad R.
Butler Gregory B.
Chowdhury Tarifur
Corning Incorporated
Stock, Jr. Gordon J
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