Optics: measuring and testing – By polarized light examination – With birefringent element
Patent
1978-04-21
1980-05-06
Corbin, John K.
Optics: measuring and testing
By polarized light examination
With birefringent element
G01B 902
Patent
active
042014735
ABSTRACT:
Apparatus is disclosed for the generation and display of interference patterns for the purpose of quantifying the distortion of either a surface or a transmitted wavefront. The invention comprises, in one embodiment, means to align the elements comprising the interferometer cavity, means to continuously magnify, i.e., zoom, the aperture diameter of the interference pattern, means to focus either the measured or limiting aperture onto the face of the vidicon, and means for transducing both the alignment spots and the interference pattern with a standard CCTV camera.
REFERENCES:
Tropel (Brochure), "Model 4000 Vertical Interfrometer," Tropel, 1000 Fairport Park, Fairport, N. Y. 14450.
Domenicali Peter L.
Hunter George C.
Corbin John K.
Sugarman Scott J.
Zucker Milton
Zygo Corporation
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