Optical interferometer measurement apparatus and method

Details Optical interferometer measurement apparatus and method Optical interferometer measurement apparatus and method

1998-07-13

1999-11-16

Kim, Robert H.

Optics: measuring and testing

By particle light scattering

With photocell detection

356346, 356352, 372 33, G01B 902

Patent

active

059867590

ABSTRACT:
Method and apparatus for realizing unusually sensitive and stable interferometric measurement capabilities. The apparatus comprises an optical interferometer with at least two optical outputs, the ratio of whose intensities can vary with a tuning parameter; and at least one detector, each of which is optically connected to the interferometer, and producing in aggregate at least two linearly-independent signals that depend on the light intensity and the tuning parameter, which are combined to produce a first measurement whose sensitivity to light intensity changes is substantially smaller than that of either of the two linearly-independent signals, and a second measurement whose sensitivity to the tuning parameter is substantially smaller than that of either of the two linearly-independent signals.

REFERENCES:
patent: 5313270 (1994-05-01), Fishman et al.

Affiliated with

Also associated with

Rating

Optical interferometer measurement apparatus and method does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Optical interferometer measurement apparatus and method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Optical interferometer measurement apparatus and method will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1331253