Optical interference system for performing interference measurem

Details Optical interference system for performing interference measurem Optical interference system for performing interference measurem

1997-09-23

1998-08-11

Font, Frank G.

Optics: measuring and testing

By particle light scattering

With photocell detection

356358, 356361, G01B 902

Patent

active

057934878

ABSTRACT:
An optical interference system includes a light source for emitting light whose wavelength can be changed, and a measuring system for changing the wavelength of the light from the light source and for performing interference measurement processes corresponding to the provided wavelengths.

REFERENCES:
patent: 5404222 (1995-04-01), Lis
Akira Ishida, "Two-Wavelength Displacement-Measuring Interferometer Using Second-Harmonic Light to Eliminate Air-Turbulence-Induced Errors", Japanese Journal of Applied Physics, vol. 28, No.3, pp. L473-L475 (Mar., 1989).

Affiliated with

Also associated with

Rating

Optical interference system for performing interference measurem does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Optical interference system for performing interference measurem, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Optical interference system for performing interference measurem will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-394473