Optical interference position measurement system

Details Optical interference position measurement system Optical interference position measurement system

1989-05-09

1991-06-25

Turner, Samuel

Optics: measuring and testing

By dispersed light spectroscopy

Utilizing a spectrometer

356356, 356363, G01B 902

Patent

active

050261622

ABSTRACT:
A position measurement system transmits moving interference pattern and these are received by a sensor fixed relative to the transmitter and a mobile sensor, by comparing the phases of the interference pattern at the two sensors the position of the mobile sensor relative to the transmitter can be calculated.

REFERENCES:
patent: 3881105 (1975-04-01), DeLang et al.
patent: 3891321 (1975-06-01), Hock
patent: 4725146 (1988-02-01), Hutchin

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