Optics: measuring and testing – Inspection of flaws or impurities
Reexamination Certificate
2006-03-28
2006-03-28
Lee, Hwa (Andrew) (Department: 2877)
Optics: measuring and testing
Inspection of flaws or impurities
C356S237400, C250S559340, C382S150000
Reexamination Certificate
active
07019826
ABSTRACT:
A three-dimensional optical inspection system reconstructs a three-dimensional image of the shape of the surface of an at least partially specular object resident on a printed circuit board by capturing two or more two-dimensional images of the object under different illumination configurations. The diffuse reflection, as well as the specular reflection can be used to reconstruct the three-dimensional image using any reconstruction method, such as photometric stereo. The different illumination configurations can be achieved using an illumination source including light-emitting elements arranged in concentric circular arrays, in which each of the circular arrays is divided into sections. Each section is independently controlled to selectively activate the sections to illuminate the object in a pre-established illumination pattern.
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Baer Richard L.
Baharav Izhak
Kakarala Ramakrishna
Vook Dietrich W.
Zhang Xuemei
Agilent Technologie,s Inc.
Lee Hwa (Andrew)
Nguyen Sang H.
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