Optics: measuring and testing – Inspection of flaws or impurities
Reexamination Certificate
2006-02-07
2006-02-07
Toatley, Jr., Gregory J. (Department: 2877)
Optics: measuring and testing
Inspection of flaws or impurities
Reexamination Certificate
active
06995837
ABSTRACT:
In a preferred embodiment, an optical inspection machine for fasteners, including: an inspection station; a main dial rotatable through the inspection station and carrying thereon a plurality of fasteners; a reflective surface surrounding each of the plurality of fasteners to permit inspection light to reflect from the reflective surface and permit viewing of an entire outer circumference of a head of each of the plurality of fasteners to detect head cracks and bursts; and a lower surface of each of the plurality of fasteners being raised above the reflective surface. A method of optically inspecting fasteners is also provided.
REFERENCES:
patent: 3709328 (1973-01-01), Mohr et al.
patent: 5777246 (1998-07-01), Woods et al.
patent: 5823356 (1998-10-01), Goodrich et al.
patent: 5918727 (1999-07-01), Wallace et al.
patent: 6055329 (2000-04-01), Mufti
patent: 6072583 (2000-06-01), Kellner
patent: 6285034 (2001-09-01), Hanna et al.
patent: 6762426 (2004-07-01), Gilliam
patent: 6787724 (2004-09-01), Bennett et al.
patent: 2004/0114113 (2004-06-01), Yamada et al.
patent: 2005/0094861 (2005-05-01), Prakash et al.
Cressotti Karl
Moir Floyd W.
Allawi Ali
Crozier John H.
Retina Systems Inc.
Toatley , Jr. Gregory J.
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