Optics: measuring and testing – Inspection of flaws or impurities – Having predetermined light transmission regions
Patent
1982-04-15
1985-11-19
McGraw, Vincent P.
Optics: measuring and testing
Inspection of flaws or impurities
Having predetermined light transmission regions
356240, 250563, G01N 2188, G01N 2190
Patent
active
045538387
ABSTRACT:
An optical inspection system (10) for deriving information from an item (12) to be inspected includes a light source (14), an optical reader (16) responsive to the light reflected from the inspected item for deriving an analog signal (83) indicative of information sensed on the inspected item, a threshold circuit (24) for setting a dynamic threshold used to convert the analog signal into a binary signal (144) indicative of the information sensed on the inspected item. The threshold circuit includes a high peak detector (100) and a low peak detector (102) responsive, respectively, to the highest peak and to the lowest peak in said analog signal for generating a high and low signal, respectively, indicative thereof. A threshold setting circuit (132) is responsive to the high signal and the low signal to set a threshold therebetween. A comparator (22) compares the analog signal with the set threshold and converts the analog signal to a binary signal indicative of the information sensed on the inspected item. An indicator (26) is provided which is responsive to the high and low signals for generating a dynamic visual indication of the difference or contrast between the high and low signals and a visual indication of the light level.
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Eaton Corporation
Grace C. H.
McGraw Vincent P.
Turner S. A.
Union M. L.
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