Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate
2005-09-19
2011-10-18
Punnoose, Roy M (Department: 2886)
Optics: measuring and testing
Inspection of flaws or impurities
Surface condition
C356S239100
Reexamination Certificate
active
08040502
ABSTRACT:
The invention is directed at a method and system of detecting defects in a transparent media such as a piece of glass. The method comprises the steps of transmitting light from a light source towards the transparent media and then detecting defects in the transparent media by scanning the light as it is reflected or passes through the transparent media. The method and system may operate in any one of a dark field mode, a bright field mode for scanning or a bright field mode for inspecting.
REFERENCES:
patent: 3814946 (1974-06-01), Shiro et al.
patent: 4306808 (1981-12-01), Vander Neut
patent: 5157266 (1992-10-01), Schmiedl
patent: 5907396 (1999-05-01), Komatsu et al.
patent: 6222624 (2001-04-01), Yonezawa
patent: 6437357 (2002-08-01), Weiss et al.
patent: 7142295 (2006-11-01), Gahagan et al.
patent: 2002/0186368 (2002-12-01), Rosengaus et al.
patent: 2252308 (2000-04-01), None
patent: 2384005 (2001-03-01), None
patent: 24370051 (2002-07-01), None
patent: 02083438 (1990-03-01), None
patent: 05087725 (1993-04-01), None
patent: 10153555 (1998-06-01), None
patent: 2002162355 (2002-06-01), None
patent: 2002529698 (2002-09-01), None
patent: 2003508786 (2003-03-01), None
patent: 20030307978 (2003-10-01), None
patent: 2005536732 (2005-12-01), None
patent: 04178545 (2011-06-01), None
patent: 2004019108 (2004-03-01), None
PCT International Searching Authority (ISA/CA), International Search Report and Written Opinion for PCT Publication No. WO 2006/029536, Dec. 19, 2005.
European Patent Office, Extended European Search Report for EP Patent App. No. 05787648.4, Sep. 2, 2010.
Sakamoto et al., “An Algorithm for Object-Light Calculation Considering Reflectance Distribution for Computer-Generated Holograms (Three-Dimensional Image Information Media)”, The Journal of the Institute of Image Formation and Television Engineers, Apr. 1, 2002, pp. 611-616, vol. 56, No. 4, The Institute of Image Information and Television Engineers, Japan.
Japanese Patent Office, Notice of Reasons for Rejection for JP Patent App. No. 2007-531555, May 19, 2011.
Thomas David P.
Weiss Adam
Borden Ladner Gervais LLP
Punnoose Roy M
WDI Wise Device Inc.
Wong Jeffrey W.
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