Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1996-11-12
1998-04-28
Pham, Hoa Q.
Optics: measuring and testing
By polarized light examination
With light attenuation
356237, G01N 2100
Patent
active
057452369
ABSTRACT:
An optical inspecting apparatus illuminates a sample with at least one of a parallel light or a diffused light. Light reflected from the sample or light transmitted through the sample is focused by a telecentric optical system and an aperture stop arranged at a back focal plane in the image space of the telecentric optical system. The sample is viewed based on light thus obtained.
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New Creation Co., Ltd.
Pham Hoa Q.
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