Optics: measuring and testing – By particle light scattering – With photocell detection
Patent
1989-02-08
1990-03-27
McGraw, Vincent P.
Optics: measuring and testing
By particle light scattering
With photocell detection
356351, G01B 902
Patent
active
049125303
ABSTRACT:
An optical heterodyne measuring apparatus for effecting measurement of a subject, based on a phase difference and a frequency difference between a reference beat beam consisting of two laser beams having different frequencies, and a measuring beat beam which consists of the reference beat beam reflected by the subject. The apparatus includes a light source device for producing a first reference beat beam having a first beat frequency, and a second reference beat beam having a second beat frequence which is lower than the first beat frequency, a beat frequency detecting device, and a phase difference detecting device. The beat frequency detecting device detects a beat frequency between the first beat frequency of the first reference beat beam, and a beat frequency of a first measuring beat beam which consists of the first reference beat beam reflected by the subject. The phase difference detecting device detects a phase difference between the second reference beat beam, and a second measuring beat beam which consists of the second reference beat beam reflected by the subject.
REFERENCES:
patent: 4558952 (1985-12-01), Kulgsh
Brother Kogyo Kabushiki Kaisha
McGraw Vincent P.
Turner S. A.
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