Optics: measuring and testing – By particle light scattering – With photocell detection
Patent
1989-05-12
1990-08-14
Willis, Davis L.
Optics: measuring and testing
By particle light scattering
With photocell detection
356351, 356359, G01B 902
Patent
active
049482513
ABSTRACT:
An optical heterodyne apparatus wherein two linearly polarized reference beams having different frequencies, and two linearly polarized measuring beams identical with the reference beams are obtained from a laser beam or beams which is/are transmitted from a laser source to a measuring portion of the apparatus through an optical fiber. The apparatus includes an optical device for obtaining two reference beams whose beat phases are different from each other by 180.degree., and two measuring beams whose beat phases are different from each other by 180.degree., a first pair of photosensors receiving the two reference beams and producing two reference beat signals; a second pair of photosensors receiving the two measuring beams and producing two measuring beat signals, a first differential amplifier receiving the reference beat signals and producing a differentially amplified output; and a second differential amplifier receiving the measuring beat signals and producing a differentially amplified output. A parameter of a subject is measured based on the outputs of the first and second differential amplifiers.
REFERENCES:
patent: 4360271 (1982-11-01), Downs et al.
patent: 4688940 (1987-08-01), Sommangron et al.
patent: 4824251 (1989-04-01), Slotwinski et al.
Brother Kogyo Kabushiki Kaisha
Koren Matthew W.
Willis Davis L.
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