Optics: measuring and testing – Material strain analysis – By light interference detector
Patent
1991-01-30
1992-12-08
Turner, Samuel A.
Optics: measuring and testing
Material strain analysis
By light interference detector
73655, 73657, 356349, G01L 124
Patent
active
051702193
ABSTRACT:
An optical heterodyne interference type detecting apparatus for measuring a displacement characteristic of a workpiece, including a device for applying a controlled physical quantity to the workpiece to induce a displacement of the workpiece, an optical heterodyne interference type displacement detecting device for detecting a difference in one of a frequency and a phase between a measuring light beam reflected by the portion of the workpiece and a reference light beam, and thereby detecting an amount of the displacement of the workpiece, and an arithmetic and control device for obtaining the displacement characteristic of the workpiece, based on the physical quantity and the amount of displacement detected by the displacement detecting device.
REFERENCES:
patent: 4412172 (1983-10-01), Vig
patent: 4432239 (1984-02-01), Bykov
patent: 4577131 (1986-03-01), Soobitsky
patent: 4581939 (1986-04-01), Takahashi
patent: 4823601 (1989-04-01), Barna
patent: 4892406 (1990-01-01), Waters
patent: 4905519 (1990-03-01), Makowsky
patent: 4928527 (1990-05-01), Burger et al.
Brother Kogyo Kabushiki Kaisha
Kurtz, II Richard E.
Turner Samuel A.
LandOfFree
Optical heterodyne interference detecting apparatus for measurin does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Optical heterodyne interference detecting apparatus for measurin, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Optical heterodyne interference detecting apparatus for measurin will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-963672