Optical harmonic microscope assembly and examination method

Details Optical harmonic microscope assembly and examination method Optical harmonic microscope assembly and examination method

1975-05-29

1977-12-20

Rubin, David H.

Optics: measuring and testing

Range or remote distance finding

With photodetection

350 15, 356 30, G02B 2100

Patent

active

040638049

ABSTRACT:
An optical harmonic microscope assembly and an examination method which provides for focusing lased coherent light as an incident beam onto a specimen, disposing the optical path of a microscope and the incident beam at a relative angle in a range which is at least as broad as 0.degree.-90.degree., blocking the fundamental frequency of the lased light and viewing light of a harmonic of said fundamental frequency generated by nonlinear diffraction by said specimen.

REFERENCES:
patent: 3621273 (1971-11-01), Rorden et al.
patent: 3792287 (1974-02-01), Roland et al.
patent: 3918793 (1975-11-01), Kraft
patent: 3975084 (1976-08-01), Block
Freund, Article in Physical Review Letters, Nov. 4, 1968, pp. 1404-1406 cited.

Affiliated with

Also associated with

Rating

Optical harmonic microscope assembly and examination method does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Optical harmonic microscope assembly and examination method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Optical harmonic microscope assembly and examination method will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-596428