Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent
1984-01-16
1986-10-21
Willis, Davis L.
Optics: measuring and testing
By dispersed light spectroscopy
Utilizing a spectrometer
356358, G01B 902
Patent
active
046182616
ABSTRACT:
A lens or fiberoptic cable focuses energy from a collimated helium neon laser beam upon a point on a mask. Some of the focused energy is reflected from the mask upon a photodetector array in an image plane, and some of this energy is reflected from a substrate closely adjacent to the mask after passing through the mask upon the photodetector array to produce an interference pattern that is sensed and characterized by a spatial frequency representative of the distance between the mask and substrate.
REFERENCES:
patent: 4072423 (1978-02-01), Kimura et al.
patent: 4352565 (1982-10-01), Rowe et al.
Green et al., "Corneal Thickness Measured by Interferometry" JOSA, vol. 65, No. 2, pp. 119-123, 2/75.
Kawasaki et al., "Modal-Noise Generation in Biconical-Taper Couplers", Optics Letters, vol. 6, No. 10, pp. 499-501, 10/81.
Flanders Dale C.
Lyszczarz Theodore M.
Hieken Charles
Koren Matthew W.
Massachusetts Institute of Technology
Willis Davis L.
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